Conversion of small functional test sets of nonscan blocks to scan patterns

Testing nonscan blocks of hardware such as small embedded memories (register files, etc.) can be done using existing scan chains due to the atypically small memory size. FastScan´s Macrotest has been developed to solve this problem, and the more interesting problem of concisely and accurately informing the user about the specific hardware and command constraints which prevent successful testing. This allows the user to quickly identify the particular problems, and add DFT or change the patterns to match the architectural and other restraints of the embedding