DocumentCode
2763150
Title
It isn´t just testing anymore (REDUX)
Author
Scheiber, Stephen F.
Author_Institution
ConsuLogic Consulting Services, Slingerlands, NY, USA
fYear
2000
fDate
2000
Firstpage
718
Lastpage
723
Abstract
For decades, test professionals touted the virtues first of design for testability and later concurrent engineering. Unfortunately, product complexity and the limitations of traditional test have reduced the effectiveness of such proactive techniques and forced us to look again at what remains within what we still call “test”. To cope with today´s challenges, test strategies must now consider taking advantage of self-tests, incorporating various forms of inspection, and minimizing overlap between test steps
Keywords
inspection; integrated circuit testing; printed circuit testing; production testing; AOI; automatic optical inspection; inspection techniques; post reflow inspection; post-paste inspection; post-placement inspection; self-tests; test strategies; Automatic testing; Built-in self-test; Concurrent engineering; Costs; Design for testability; Inspection; Manufacturing; Marine vehicles; Nails; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894267
Filename
894267
Link To Document