DocumentCode :
2763156
Title :
[Front matter]
fYear :
2006
fDate :
15-17 May 2006
Abstract :
The following topics are dealt with: strained Si FET/CMOS and technology; germanium device technology; optoelectronics and Ge FETs; Ge MIS/MOS technology; selective epitaxy; heterostructure growth; quantum devices; virtual substrates; heterojunction bipolar transistors; semiconductor process technology
Keywords :
MIS devices; elemental semiconductors; field effect transistors; germanium; heterojunction bipolar transistors; optoelectronic devices; semiconductor technology; silicon; CMOS device; FET device; Ge; HBT circuits; HBT devices; MIS technology; MOS technology; Si; heterojunction bipolar transistors; heterostructure growth; optoelectronics; quantum devices; selective epitaxy; virtual substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
Conference_Location :
Princeton, NJ
Print_ISBN :
1-4244-0461-4
Type :
conf
DOI :
10.1109/ISTDM.2006.246567
Filename :
1715936
Link To Document :
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