Title :
Temperature dependence of complex permittivity of planar microwave materials
Author :
Jacob, Mohan V. ; Krupka, Jerzy ; Maziersk, Janina ; Bialkowski, Marek
Author_Institution :
James Cook Univ., Townsville
Abstract :
Fabrication of dielectric materials with low losses at microwave frequencies and stable dielectric properties under varying temperatures is an important and challenging area of research. In this paper characterisation of several planar dielectrics at microwave frequencies (~9.5 GHz) in the temperature range from 20 K to 290 K using a split post dielectric resonator has been presented. We have compared temperature stability of measured dielectric properties of RT5880, RT6010, LTCC, FR4 and Ba(MgxTay)O3 materials. Presented results are useful for selection of a material suitable for a specific application.
Keywords :
dielectric materials; dielectric resonators; microwave materials; permittivity; complex permittivity; dielectric materials fabrication; planar microwave materials; split post dielectric resonator; stable dielectric properties; temperature 20 K to 290 K; temperature dependence; Dielectric losses; Dielectric materials; Dielectric measurements; Fabrication; Microwave frequencies; Permittivity; Stability; Temperature dependence; Temperature distribution; Temperature measurement; Dielectric Materials; Dielectric Resonator; Microwave Characterisation; Permittivity;
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
DOI :
10.1109/APMC.2006.4429680
