DocumentCode :
2763193
Title :
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis
Author :
Stanojevic, Zoran ; Balachandran, Hari ; Walker, D.M.H. ; Lakbani, F. ; Jandhyala, Sri ; Saxena, Jayashree ; Butler, Kenneth M.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear :
2000
fDate :
2000
Firstpage :
729
Lastpage :
738
Abstract :
Defect diagnosis in random logic is currently done using the stuck-at fault model, while most defects seen in manufacturing result in bridging faults. In this work we use physical design and test failure information combined with bridging and stuck-at fault models to localize defects in random logic. We term this approach computer-aided fault to defect mapping (CAFDM). We build on top of the existing mature stuck-at diagnosis infrastructure. The performance of the CAFDM software was tested by injecting bridging faults into samples of a Streaming audio controller chip and comparing the predicted defect locations and layers with the actual values. The correct defect location and layer was predicted in all 9 samples for which scan-based diagnosis could be performed. The experiment was repeated on production samples that failed scan test, with promising results
Keywords :
automatic test pattern generation; fault simulation; integrated circuit testing; logic CAD; logic testing; FastScan; Hamming distance match; bridging fault models; computer-aided fault to defect mapping; defect diagnosis; fault isolation; physical design information; random logic; scan-based diagnosis; short circuit faults; software performance; stuck-at fault models; test failure information; Automatic test pattern generation; Circuit faults; Circuit testing; Computer science; Drives; Fault diagnosis; Instruments; Logic circuits; Logic testing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-6546-1
Type :
conf
DOI :
10.1109/TEST.2000.894269
Filename :
894269
Link To Document :
بازگشت