Title :
DIST-based detection and diagnosis of multiple faults in FPGAs
Author :
Abramovici, Miron ; Stroud, Charles
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
Abstract :
We present a BIST-based approach able to detect and accurately diagnose any single and most multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs). For any faulty PLB, we also identify its internal faulty modules or modes of operation. This accurate diagnosis provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance. We present experimental results showing detection and identification of faulty PLBs in actual defective FPGAs
Keywords :
automatic test pattern generation; built-in self test; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; ATPG; BIST-based detection; FPGA; failure analysis; fault diagnosis; fault-tolerance; internal faulty modules; modes of operation; multiple faulty programmable logic blocks; repair strategy; single faulty programmable logic blocks; yield improvement; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Programmable logic arrays; System testing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894275
