DocumentCode :
2763381
Title :
Ge/SiGe Quantum Confined Stark Effect Modulators on Silicon
Author :
Harris, James S. ; Yu-Hsuan Kuo ; Miller, David A. B.
Author_Institution :
Solid State & Photonics Lab., Stanford Univ., CA
fYear :
2006
fDate :
15-17 May 2006
Firstpage :
1
Lastpage :
2
Abstract :
We have demonstrated efficient QCSE in silicon-based structures, using strained Ge MQWs. The behavior of the exciton peaks, the band edge shift and the shift in absorption coefficient are comparable to those observed in III-V materials at similar wavelengths. Our materials and fabrication processes are completely CMOS compatible and suitable for mass production. This approach is therefore very promising for silicon-based electro-absorption modulators operating at high speed, low power, and low operating voltage and with small device areas
Keywords :
Ge-Si alloys; electro-optical modulation; electroabsorption; elemental semiconductors; excitons; germanium; quantum confined Stark effect; semiconductor quantum wells; CMOS process; Ge-SiGe; absorption coefficient; band edge shift; exciton peaks; quantum confined Stark effect modulators; quantum well; silicon-based electro-absorption modulators; Absorption; CMOS process; Excitons; Fabrication; Germanium silicon alloys; III-V semiconductor materials; Potential well; Quantum well devices; Silicon germanium; Stark effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
Conference_Location :
Princeton, NJ
Print_ISBN :
1-4244-0461-4
Type :
conf
DOI :
10.1109/ISTDM.2006.246579
Filename :
1715948
Link To Document :
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