Design of H-shaped low actuation-voltage RF-MEMS switches

Low actuation-voltage and high reliable microelectromechanical systems (MEMS) shunt capacitive and shunt resistive switches are in this paper proposed. Electrostatic-mechanical coupling using finite element method (FEM) and full-wave electromagnetic (EM) analyses have been performed. The mechanical design of a low spring-constant switch structure has been optimized by calculating the dependence of the actuation voltage on the membrane shape, material properties and geometrical sizes. The proposed switches, based on Al metallization membrane, show a pull-in voltage around 7 and 13 Volts with 0 and 20 MPa residual stresses, respectively. The simulated insertion losses are less than 0.25 dB up to 40GHz with a return loss of about 20 dB in the ON- state. The isolations in the OFF-state for the capacitive-switch are greater than 20 and 35 dB at 12 and 40 GHz, respectively. The shunt resistive switch theoretically works from zero frequency with isolation greater than 25 dB up to 40 GHz. The fabrication of those switches is compatible with standard CMOS technology and they are in process.