DocumentCode :
2763708
Title :
HD2BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
Author :
Benso, Alfredo ; Chiusano, Silvia ; Carlo, Stefano Di ; Prinetto, Paolo ; Ricciato, Fabio ; Spadari, Maurizio ; Zorian, Yervant
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
fYear :
2000
fDate :
2000
Firstpage :
892
Lastpage :
901
Abstract :
Proposes HD2BIST, a complete hierarchical framework for BIST scheduling, data patterns delivering, and diagnosis of a complex system including embedded cores with different test requirements as full scan cores, partial scan cores, or BIST-ready cores. The main goal of HD 2BIST is to maximize and simplify the reuse of the built-in test architectures, giving the chip designer the highest flexibility in planning the overall SoC test strategy. HD2BIST defines a test access method able to provide a direct “virtual” access to each core of the system, and can be conceptually considered as a powerful complement to the P1500 standard, whose main target is to make the test interface of each core independent from the vendor
Keywords :
built-in self test; circuit layout CAD; integrated circuit testing; logic testing; scheduling; BIST scheduling; BIST-ready cores; HD2BIST; P1500 standard; SoC test strategy; built-in test architectures; data patterns delivery; embedded cores; full scan cores; hierarchical framework; partial scan cores; test access method; test interface; Automatic logic units; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Energy consumption; Hardware; Large scale integration; Logic testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-6546-1
Type :
conf
DOI :
10.1109/TEST.2000.894300
Filename :
894300
Link To Document :
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