Title :
Microwave test mismatch and power de-embedding
Author :
Higgins, Peter ; Lampos, Jim
Author_Institution :
Intersil/Teradyne, Palm Bay, FL, USA
Abstract :
This paper describes power de-embedding, a new breakthrough ATE Uwave test technique. Power de-embedding enables an accurate RF power level to be delivered to the DUT under non-ideal match conditions
Keywords :
S-parameters; automatic test equipment; electronic equipment testing; microwave measurement; power supplies to apparatus; 1 GHz; ATE Uwave test; DUT; RF power level; S parameter measurement; microwave test mismatch; over 1 GHz; power de-embedding; Automatic testing; Fixtures; Gain measurement; Power amplifiers; Power engineering and energy; Power measurement; Radio frequency; Scattering parameters; Semiconductor device testing; Test equipment;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894306
