Title :
Jitter measurements of a PowerPCTM microprocessor using an analytic signal method
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Halter, David ; Nissen, Jim ; Raina, Rajesh ; Ishida, Masahiro ; Watanabe, Toshifumi
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
Abstract :
This paper demonstrates a new method for measuring both peak-to-peak and RMS jitter in PLL output signals. The theoretical basis for this method is derived from analytic signal theory. To validate the method, experimental data from PowerPCTM microprocessor jitter measurements is compared with results obtained with the conventional time interval analyzer (TIA) technique
Keywords :
computer testing; integrated circuit testing; microprocessor chips; signal processing; timing jitter; PLL output signals; PowerPCTM microprocessor; analytic signal; analytic signal method; analytic signal theory; digital oscilloscope; microprocessor jitter measurements; peak-to-peak and RMS jitter; phase perturbation; time interval analyser; Clocks; Costs; Frequency measurement; Histograms; Laboratories; Microprocessors; Signal analysis; Testing; Time measurement; Timing jitter;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894307
