DocumentCode
2763835
Title
Jitter measurements of a PowerPCTM microprocessor using an analytic signal method
Author
Yamaguchi, Takahiro J. ; Soma, Mani ; Halter, David ; Nissen, Jim ; Raina, Rajesh ; Ishida, Masahiro ; Watanabe, Toshifumi
Author_Institution
Advantest Labs. Ltd., Miyagi, Japan
fYear
2000
fDate
2000
Firstpage
955
Lastpage
964
Abstract
This paper demonstrates a new method for measuring both peak-to-peak and RMS jitter in PLL output signals. The theoretical basis for this method is derived from analytic signal theory. To validate the method, experimental data from PowerPCTM microprocessor jitter measurements is compared with results obtained with the conventional time interval analyzer (TIA) technique
Keywords
computer testing; integrated circuit testing; microprocessor chips; signal processing; timing jitter; PLL output signals; PowerPCTM microprocessor; analytic signal; analytic signal method; analytic signal theory; digital oscilloscope; microprocessor jitter measurements; peak-to-peak and RMS jitter; phase perturbation; time interval analyser; Clocks; Costs; Frequency measurement; Histograms; Laboratories; Microprocessors; Signal analysis; Testing; Time measurement; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894307
Filename
894307
Link To Document