• DocumentCode
    2763863
  • Title

    Algorithm level re-computing with shifted operands-a register transfer level concurrent error detection technique

  • Author

    Wu, Kaijie ; Karri, Ramesh

  • Author_Institution
    Dept. of Electr. Eng., Polytech. Univ., Brooklyn, NY, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    971
  • Lastpage
    978
  • Abstract
    Re-computing with shifted operands (RESO) is a logic level time redundancy based concurrent error detection (CED) technique. In RESO, logic level operations (and, nand, etc) are carried out twice-once on the basic input and once on the shifted input. Results from these two operations are compared to detect an error. Although using RESO operators in register transfer level (RTL) designs is straightforward, it entails time and area overhead. We developed an RTL CED technique called algorithm level re-computing with shifted operands (ARESO). ARESO does not use specialized RESO operators. Rather, it exploits RTL scheduling, pipelining, operator chaining, and multi-cycling to incorporate user specified error detection latencies. ARESO supports hardware vs. performance vs. error detection latency trade-offs. ARESO has been validated on practical design examples using Synopsys Behavior Compiler
  • Keywords
    VLSI; adders; dividing circuits; error detection; fault tolerant computing; high level synthesis; logic testing; multiplying circuits; pipeline processing; redundancy; ARESO technique; FIR filter; RTL scheduling; Synopsys Behavior Compiler; VLSI reliability; algorithm level re-computing; array multiplier; checking ratio; concurrent error detection technique; logic level time redundancy based; multi-cycling; operator chaining; pipelining; re-computing with shifted operands; register transfer level; user specified error detection latencies; Bidirectional control; Circuit faults; Delay; Electrical fault detection; Error correction; Fault detection; Hardware; Job shop scheduling; Logic testing; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894309
  • Filename
    894309