Performance analysis of PSK systems in the presence of slow fading, imperfect carrier phase recovery, and AWGN

Author

Al Falujah, Iyad ; Prabhu, Vasant K.

Author_Institution

Dept. of Electr. Eng., Texas Univ., Arlington, TX

fYear

2005

fDate

1-4 May 2005

Firstpage

1859

Lastpage

1862

Abstract

Using Fourier series expansion and associated Legendre functions, the average bit error probability (BEP) of the binary and quaternary phase shift keying (BPSK and QPSK respectively) on a single channel (no diversity) in the presence of different kinds of slow fading channels (Rayleigh, Nakagami-m, and Rician), phase recovery error, and additive white Gaussian noise (AWGN) has been evaluated. The detection loss for both of BPSK and QPSK has been calculated. The series expressions of the average BEP proposed in our study are found to be converged with reasonable number of terms. The accuracy of the results is verified by computer simulation. Although our approach is devoted for the PSK systems, it can be easily extended to other modulation schemes and noise impairments

Keywords

AWGN channels; Fourier series; Nakagami channels; Rayleigh channels; Rician channels; error statistics; quadrature phase shift keying; AWGN; BPSK; Fourier series expansion; Legendre functions; Nakagami-m channels; QPSK; Rayleigh channels; Rician channels; additive white Gaussian noise; average bit error probability; binary phase shift keying; carrier phase recovery; quaternary phase shift keying; slow fading channels; AWGN; Additive white noise; Binary phase shift keying; Error probability; Fading; Fourier series; Performance analysis; Phase shift keying; Quadrature phase shift keying; Rayleigh channels;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Computer Engineering, 2005. Canadian Conference on

Conference_Location

Saskatoon, Sask.

ISSN

0840-7789

Print_ISBN

0-7803-8885-2

Type

conf

DOI

10.1109/CCECE.2005.1557344

Filename

1557344