Title :
Challenges of high supply currents during VLSI test
Author :
Johnson, Gerald H.
Author_Institution :
Teradyne Inc., Fridley, MN, USA
Abstract :
Very high power supply currents required during test of advanced VLSI parts pose problems for both the ATE power supply and the interconnect to the DUT. Power supply design, inductance, resistance, filter capacitance and sense points all become critical. Design of the DUT interface board requires careful attention to detail
Keywords :
VLSI; automatic test equipment; capacitance; inductance; integrated circuit testing; power supplies to apparatus; ATE power supply; DUT interconnect; DUT interface board design; VLSI test; advanced VLSI parts; current capability; filter capacitance; interconnect inductance; interconnect resistance; response time; sense points; very high power supply currents; voltage drop; Bandwidth; Capacitance; Current supplies; Delay; Inductance; Power supplies; Rivers; Testing; Very large scale integration; Voltage;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894314
