Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis

Author

Huang, Jiun-Lang ; Cheng, Kwang-Ting

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

fYear

2000

fDate

2000

Firstpage

1021

Lastpage

1030

Abstract

Delta-sigma modulation has become popular in modern analog-to-digital modulator design due to its relatively high immunity from process variations. We propose efficient characterization techniques to obtain the key performance parameters of the 1-bit first-order delta-sigma modulator which is intended to be used as an on-chip analog signal digitizer for BIST applications. Numerical simulations have been performed to validate the techniques and the results indicate that accurate estimation of the parameters can be obtained at the presence of noise

Keywords

automatic testing; built-in self test; delta-sigma modulation; BIST applications; DC offset; modulator testing; noisy ramps; numerical simulations; on-chip analog signal analysis; on-chip analog signal digitizer; one-bit first-order delta-sigma modulator; oversampling modulation; performance parameters; transfer curve; Automatic testing; Built-in self-test; Circuit testing; Delta modulation; Digital modulation; Digital signal processing; Numerical simulation; Signal analysis; Signal generators; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2000. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-6546-1

Type

conf

DOI

10.1109/TEST.2000.894315

Filename

894315