• DocumentCode
    2764107
  • Title

    Nouveau wrapper P1500 incorporant une structure bist pour le test des IP et des interconnexions d´un SoC

  • Author

    Larab, Abdelaziz ; Khouas, Abdelhakim

  • Author_Institution
    Departement genie Electrique, Ecole Polytech. de Montreal, Que.
  • fYear
    2005
  • fDate
    1-4 May 2005
  • Firstpage
    1902
  • Lastpage
    1905
  • Abstract
    In this paper we have presented a new compact test architecture configurable in P1500 mode and BIST mode. An application and results are given
  • Keywords
    built-in self test; industrial property; system-on-chip; BIST; IP; Intellectual Property; P1500 wrapper; SOC; built-in-self-test; wiring interconnects; Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Design for testability; Fabrication; Intellectual property; Performance evaluation; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2005. Canadian Conference on
  • Conference_Location
    Saskatoon, Sask.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-8885-2
  • Type

    conf

  • DOI
    10.1109/CCECE.2005.1557354
  • Filename
    1557354
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2764107