Title :
Nouveau wrapper P1500 incorporant une structure bist pour le test des IP et des interconnexions d´un SoC
Author :
Larab, Abdelaziz ; Khouas, Abdelhakim
Author_Institution :
Departement genie Electrique, Ecole Polytech. de Montreal, Que.
Abstract :
In this paper we have presented a new compact test architecture configurable in P1500 mode and BIST mode. An application and results are given
Keywords :
built-in self test; industrial property; system-on-chip; BIST; IP; Intellectual Property; P1500 wrapper; SOC; built-in-self-test; wiring interconnects; Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Design for testability; Fabrication; Intellectual property; Performance evaluation; System testing; System-on-a-chip;
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
Print_ISBN :
0-7803-8885-2
DOI :
10.1109/CCECE.2005.1557354
