• DocumentCode
    2764113
  • Title

    An analysis of the delay defect detection capability of the ECR test method

  • Author

    Kim, Seonlu ; Chakravarty, Sreejit ; Vinnakota, Bapiraju

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1060
  • Lastpage
    1069
  • Abstract
    An analysis of the energy consumption ratio (ECR) test method, based on simulation study of resistive bridges and resistive opens, is presented. These defect classes comprise a very significant percentage of the defects causing speed failures. We show: (i) bridges causing delay failures and detectable by the difference IDDQ method is detected by the ECR test method; and (ii) bridges and opens causing delay failures but not detectable by the difference IDDQ method are also detected by the ECR test method. This highlights a very significant advantage of the ECR test method over IDDQ test methods. The underlying reason as to why the ECR test method is good at detecting delay defects is presented. Based on that we develop a new test method called the ECR-VDD test. The usefulness of the new method in detecting delay defects is validated using simulation results
  • Keywords
    delays; integrated circuit testing; ECR-VDD test; delay defect detection; difference IDDQ testing; energy consumption ratio test method; failure mechanism; numerical simulation; resistive bridge; resistive open; Analytical models; Automatic test equipment; Bridge circuits; Circuit testing; Computational modeling; Costs; Delay; Energy consumption; Leakage current; Plugs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894319
  • Filename
    894319