DocumentCode :
2764217
Title :
Use of spread spectrum time domain reflectometry to estimate state of health of power converters
Author :
Nasrin, M. Sultana ; Khan, Faisal H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2012
fDate :
10-13 June 2012
Firstpage :
1
Lastpage :
6
Abstract :
A new online measurement and analysis method has been presented in this paper to identify the state of health of power converter circuits. Using spread spectrum time domain reflectometry (SSTDR), impedance in the various current paths inside the converter as well as any fault can be identified without interrupting the circuit´s normal operation. Multiple sets of test data have been generated while the SSTDR process is applied to each of the components i.e. the power MOSFETs, the dc bus capacitor and the load. These obtained test data are analyzed to show how these test results are consistent with the impedances in various current paths. An impedance matrix was formed for a non-aged converter and a corresponding matrix using SSTDR data was formed as well. The matrices could be formed for any power converter, and the impedance matrix for the non-aged converter could be considered as a “Reference matrix” for comparison purpose. By comparing these two matrices, the variation in path impedances due to aging could be determined. This research aims to identify the measurable quantities to characterize the aging process, their origins of these quantities and propose convenient methods to measure them.
Keywords :
power MOSFET; power capacitors; power convertors; time-domain reflectometry; dc bus capacitor; impedance matrix; non-aged converter; online measurement; power MOSFET; power converter circuits; power converters; reference matrix; spread spectrum time domain reflectometry; Aging; Capacitors; Impedance; Logic gates; MOSFETs; Matrix converters; Resistance; Equivalent Series Resistance (ESR); ON - state resistance; Reflectometry; Spread Spectrum Time Domain Reflectometry (SSTDR); Time Domain Reflectometry (TDR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Modeling for Power Electronics (COMPEL), 2012 IEEE 13th Workshop on
Conference_Location :
Kyoto
ISSN :
1093-5142
Print_ISBN :
978-1-4244-9372-2
Electronic_ISBN :
1093-5142
Type :
conf
DOI :
10.1109/COMPEL.2012.6251790
Filename :
6251790
Link To Document :
بازگشت