DocumentCode :
2764655
Title :
Test results of various CMOS image sensor pixels
Author :
Li, David C Y ; Gaudet, Vincent C. ; Basu, Anup
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta.
fYear :
2005
fDate :
1-4 May 2005
Firstpage :
2017
Lastpage :
2020
Abstract :
Today, CMOS image sensors are increasingly used in consumer products. Digital cameras, Web cameras, optical mouses, and smart sensors are some examples. One of the most used CMOS image sensor architectures is based on the active pixel sensor (APS). In order to understand more design tradeoffs, a prototype chip was designed to evaluate different pixel architectures. This paper describes the prototype chip and the test results. The prototype chip is composed of 8 different pixels and a 3-to-8 row decoder. There are two different APS architectures, 3 transistor or 4 transistor. The 8 different pixels are based on the 2 APS architectures with some variations. These variations are 2 types of reset transistor, Nmos or Pmos, and 2 types of photodiodes, n+ - psub and nwell - psub. The prototype chip was manufactured in a standard 3.3 V 0.35 mum 1-poly 4-metal CMOS process. The row decoder was designed using a pass transistor network, inverters, and pull-up transistors. The test results show that for white light, n+ - psub photodiodes and nwell - psub photodiodes have approximately the same response. Also, 4 transistor pixels have better response, but the voltage range for linear operation is smaller. 3 transistor pixels have larger voltage range for linear operation and less dark current. The results also confirm that the output of the pixels is inversely proportional to the distance of the light source
Keywords :
CMOS image sensors; photodiodes; CMOS image sensor pixels; active pixel sensor; inverters; photodiodes; prototype chip; pull-up transistors; row decoder; transistor network; CMOS image sensors; Consumer products; Decoding; Digital cameras; Intelligent sensors; Photodiodes; Pixel; Prototypes; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
ISSN :
0840-7789
Print_ISBN :
0-7803-8885-2
Type :
conf
DOI :
10.1109/CCECE.2005.1557381
Filename :
1557381
Link To Document :
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