• DocumentCode
    2764655
  • Title

    Test results of various CMOS image sensor pixels

  • Author

    Li, David C Y ; Gaudet, Vincent C. ; Basu, Anup

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta.
  • fYear
    2005
  • fDate
    1-4 May 2005
  • Firstpage
    2017
  • Lastpage
    2020
  • Abstract
    Today, CMOS image sensors are increasingly used in consumer products. Digital cameras, Web cameras, optical mouses, and smart sensors are some examples. One of the most used CMOS image sensor architectures is based on the active pixel sensor (APS). In order to understand more design tradeoffs, a prototype chip was designed to evaluate different pixel architectures. This paper describes the prototype chip and the test results. The prototype chip is composed of 8 different pixels and a 3-to-8 row decoder. There are two different APS architectures, 3 transistor or 4 transistor. The 8 different pixels are based on the 2 APS architectures with some variations. These variations are 2 types of reset transistor, Nmos or Pmos, and 2 types of photodiodes, n+ - psub and nwell - psub. The prototype chip was manufactured in a standard 3.3 V 0.35 mum 1-poly 4-metal CMOS process. The row decoder was designed using a pass transistor network, inverters, and pull-up transistors. The test results show that for white light, n+ - psub photodiodes and nwell - psub photodiodes have approximately the same response. Also, 4 transistor pixels have better response, but the voltage range for linear operation is smaller. 3 transistor pixels have larger voltage range for linear operation and less dark current. The results also confirm that the output of the pixels is inversely proportional to the distance of the light source
  • Keywords
    CMOS image sensors; photodiodes; CMOS image sensor pixels; active pixel sensor; inverters; photodiodes; prototype chip; pull-up transistors; row decoder; transistor network; CMOS image sensors; Consumer products; Decoding; Digital cameras; Intelligent sensors; Photodiodes; Pixel; Prototypes; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2005. Canadian Conference on
  • Conference_Location
    Saskatoon, Sask.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-8885-2
  • Type

    conf

  • DOI
    10.1109/CCECE.2005.1557381
  • Filename
    1557381