Title :
A highly accurate planar near-field scanner
Author :
Shannon, F.E. ; Luzwick, J.L.
Author_Institution :
Hughes Aircraft Company, Culver City and El Segundo, CA, USA
Keywords :
Antenna measurements; Frequency measurement; Mechanical variables measurement; Microwave antennas; Millimeter wave measurements; Optical interferometry; Optical surface waves; Position measurement; Probes; Testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1981
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/APS.1981.1148530