DocumentCode :
2764801
Title :
Analysis using bi-spectral related techniques
Author :
Hippenstiel, Ralph
Author_Institution :
Naval Postgraduate Sch., Monterey, CA, USA
Volume :
2
fYear :
1994
fDate :
3-5 Aug 1994
Firstpage :
1331
Abstract :
This paper investigates the use of bi-spectral related techniques to obtain detection clues from time-frequency representations. Earlier results have indicated that 1.5-D spectral techniques (a degenerate version of the bi-spectrum) has potential signal to noise ratio (SNR) gain over conventional techniques. This is partially due to the rejection of Gaussian like perturbations by the cumulant based techniques. The third order moment for Gaussian zero mean random processes is essentially zero. A comparison using synthetic data via conventional spectrogram, instantaneous power spectrum, and the cumulant based technique is provided
Keywords :
Gaussian noise; higher order statistics; spectral analysis; time-frequency analysis; Gaussian like perturbations; Gaussian zero mean random processes; bi-spectral related techniques; cumulant based techniques; instantaneous power spectrum; signal to noise ratio gain; third order moment; time-frequency representations; Delay; Displays; Fourier transforms; Gaussian noise; Government; Integrated circuit noise; Protection; Random processes; Signal analysis; Signal to noise ratio; Spectrogram; Time frequency analysis; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
Type :
conf
DOI :
10.1109/MWSCAS.1994.519055
Filename :
519055
Link To Document :
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