• DocumentCode
    2764869
  • Title

    Intense Photoluminescence from Ge(Si) Self-Assembled Islands Embedded in a Tensile-Strained Si Layer

  • Author

    Novikov, A.V. ; Shaleev, M.V. ; Yablonskiy, A.N. ; Kuznetsov, O.A. ; Drozdov, Y.N. ; Lobanov, D.N. ; Krasilnik, Z.F.

  • Author_Institution
    Inst. for Phys. of Microstructures, Russian Acad. of Sci., Novgorod
  • fYear
    2006
  • fDate
    15-17 May 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The interest in the Ge/Si heterostructures with self-assembled islands is associated with their potential use for Si-based optoelectronic devices. Due to the effective hole 3D confinement a photoluminescence (PL) signal from Ge(Si) islands was observed up to room temperature. However, only holes are effectively localized in Ge(Si) islands, while electrons are only weakly confined in Si on the heterojunction with an island. A weak confinement of electrons is one possible reason for the rather low PL intensity from islands. It is known that the tensile-strained Si layer (e-Si layer) grown on relaxed SiGe buffer is an effective potential well for the electrons. The embedding of Ge(Si) islands in such a e-Si layer will essentially improve the localization of electrons on the heterojunction with an island which can result in the increase of PL signal from islands. In this paper we report on photoluminescence study of structures with Ge(Si) islands embedding between e-Si layer
  • Keywords
    elemental semiconductors; germanium; optoelectronic devices; photoluminescence; self-assembly; silicon; Ge-Si; Ge/Si heterostructures; hole 3D confinement; optoelectronic devices; photoluminescence signal; self-assembled islands; Charge carrier processes; Electron optics; Energy states; Germanium silicon alloys; Heterojunctions; Optical buffering; Photoluminescence; Potential well; Silicon germanium; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    1-4244-0461-4
  • Type

    conf

  • DOI
    10.1109/ISTDM.2006.246526
  • Filename
    1716020