DocumentCode :
2764901
Title :
Surface degradation of polymer insulators under accelerated climatic aging in weather-ometer
Author :
Xu, Guoxiang ; McGrath, Paul B. ; Burns, Clayton W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
Volume :
1
fYear :
1996
fDate :
16-19 Jun 1996
Firstpage :
291
Abstract :
Climatic aging experiments were conducted on two types of outdoor polymer insulators by using a programmable weather-ometer. The housing materials for the insulators were silicone rubber (SR) and ethylene propylene diene monomer (EPDM). The accelerated aging stresses were comprised of ultraviolet radiation, elevated temperature, temperature cycling, thermal shock and high humidity. Their effects on the insulator surface conditions and electrical performance were examined through visual inspection and SEM studies, contact angle measurements, thermogravimetric analysis (TGA), energy dispersive spectroscopy (EDS) analysis and 50% impulse flashover voltage tests. The results showed a significant damage on the insulator surface caused by some of the imposed aging stresses. The EDS analysis suggested a photooxidation process that happened on the insulator surface during the aging period
Keywords :
ageing; electric breakdown; flashover; insulation testing; insulator testing; life testing; polymer insulators; surface discharges; thermal analysis; SEM; accelerated aging stresses; aging stresses; climatic aging experiments; contact angle measurements; electrical performance; elevated temperature; energy dispersive spectroscopy; ethylene propylene diene monomer; housing materials; humidity; impulse flashover voltage tests; insulator surface conditions; outdoor polymer insulators; photooxidation process; silicone rubber; surface degradation; temperature cycling; thermal shock; thermogravimetric analysis; ultraviolet radiation; visual inspection; Acceleration; Aging; Conducting materials; Performance analysis; Plastic insulation; Polymers; Rubber; Temperature; Thermal degradation; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1089-084X
Print_ISBN :
0-7803-3531-7
Type :
conf
DOI :
10.1109/ELINSL.1996.549339
Filename :
549339
Link To Document :
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