DocumentCode :
2765030
Title :
A new microwave-excited plasma source using an internal dielectric microwave applicator
Author :
Shimatani, Kohei ; Tsugami, Yoshikazu ; Ganachev, Ivan P.
Author_Institution :
Shibaura Mechatronics Corp., Yokohama
fYear :
2006
fDate :
12-15 Dec. 2006
Firstpage :
1919
Lastpage :
1922
Abstract :
Microwave plasma is widely used for plasma processing, especially plasma chemistry and chemical dry etching. Its main advantages are operation at wide pressure ranges, low plasma potentials, absence of high-energy ion flax at the substrate and chamber walls, relatively small damage at the processed surface and clean plasma environment provided by the absence of extensive wall abrasion. However, standing-wave mode jumps make continuous plasma density control problematic. The present contribution reports one effective solution to this problem: a mode-jump free internal dielectric microwave applicator.
Keywords :
dielectric devices; microwave devices; plasma density; plasma devices; chamber walls; chemical dry etching; continuous plasma density control; high-energy ion flax; internal dielectric microwave applicator; microwave-excited plasma source; plasma chemistry; plasma processing; standing-wave mode jumps; Applicators; Chemical processes; Dielectric substrates; Dry etching; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma sources; Surface cleaning; internal dielectric microwave applicator; microwave plasma; mode jump;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
Type :
conf
DOI :
10.1109/APMC.2006.4429783
Filename :
4429783
Link To Document :
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