DocumentCode
2765030
Title
A new microwave-excited plasma source using an internal dielectric microwave applicator
Author
Shimatani, Kohei ; Tsugami, Yoshikazu ; Ganachev, Ivan P.
Author_Institution
Shibaura Mechatronics Corp., Yokohama
fYear
2006
fDate
12-15 Dec. 2006
Firstpage
1919
Lastpage
1922
Abstract
Microwave plasma is widely used for plasma processing, especially plasma chemistry and chemical dry etching. Its main advantages are operation at wide pressure ranges, low plasma potentials, absence of high-energy ion flax at the substrate and chamber walls, relatively small damage at the processed surface and clean plasma environment provided by the absence of extensive wall abrasion. However, standing-wave mode jumps make continuous plasma density control problematic. The present contribution reports one effective solution to this problem: a mode-jump free internal dielectric microwave applicator.
Keywords
dielectric devices; microwave devices; plasma density; plasma devices; chamber walls; chemical dry etching; continuous plasma density control; high-energy ion flax; internal dielectric microwave applicator; microwave-excited plasma source; plasma chemistry; plasma processing; standing-wave mode jumps; Applicators; Chemical processes; Dielectric substrates; Dry etching; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma sources; Surface cleaning; internal dielectric microwave applicator; microwave plasma; mode jump;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location
Yokohama
Print_ISBN
978-4-902339-08-6
Electronic_ISBN
978-4-902339-11-6
Type
conf
DOI
10.1109/APMC.2006.4429783
Filename
4429783
Link To Document