• DocumentCode
    2765030
  • Title

    A new microwave-excited plasma source using an internal dielectric microwave applicator

  • Author

    Shimatani, Kohei ; Tsugami, Yoshikazu ; Ganachev, Ivan P.

  • Author_Institution
    Shibaura Mechatronics Corp., Yokohama
  • fYear
    2006
  • fDate
    12-15 Dec. 2006
  • Firstpage
    1919
  • Lastpage
    1922
  • Abstract
    Microwave plasma is widely used for plasma processing, especially plasma chemistry and chemical dry etching. Its main advantages are operation at wide pressure ranges, low plasma potentials, absence of high-energy ion flax at the substrate and chamber walls, relatively small damage at the processed surface and clean plasma environment provided by the absence of extensive wall abrasion. However, standing-wave mode jumps make continuous plasma density control problematic. The present contribution reports one effective solution to this problem: a mode-jump free internal dielectric microwave applicator.
  • Keywords
    dielectric devices; microwave devices; plasma density; plasma devices; chamber walls; chemical dry etching; continuous plasma density control; high-energy ion flax; internal dielectric microwave applicator; microwave-excited plasma source; plasma chemistry; plasma processing; standing-wave mode jumps; Applicators; Chemical processes; Dielectric substrates; Dry etching; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma sources; Surface cleaning; internal dielectric microwave applicator; microwave plasma; mode jump;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2006. APMC 2006. Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-4-902339-08-6
  • Electronic_ISBN
    978-4-902339-11-6
  • Type

    conf

  • DOI
    10.1109/APMC.2006.4429783
  • Filename
    4429783