• DocumentCode
    2765121
  • Title

    Metallurgical reaction in soldered thick films

  • Author

    Chiou, Bi-Shiou ; Liu, K.C. ; Duh, Jenq-Gong

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    350
  • Abstract
    Summary form only given, as follows. Pb/Sn solder and Pd/Ag thick-film conductor joints are formed by dipping and reflowing. The microstructure of the joints is investigated with emphasis on the metallurgical reaction between the solder and the thick-film materials. The morphology of the fracture surface in the conductor-solder interface after tensile test is evaluated by means of an electron microscope. The nature of the metallurgical reaction at the joint interface, the elemental redistribution around the fracture surface, and the formation of the intermetallic compound after aging and/or thermal cycling test are discussed
  • Keywords
    lead alloys; palladium alloys; reliability; silver alloys; soldering; thick film circuits; tin alloys; PbSn-PdAg; aging; conductor-solder interface; dip soldering; elemental redistribution; fracture surface; intermetallic compound; joint interface; metallurgical reaction; microstructure; morphology; reflow soldering; soldered thick films; tensile test; thermal cycling test; Conducting materials; Electrons; Inorganic materials; Joining materials; Microstructure; Surface cracks; Surface morphology; Testing; Thick films; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76173
  • Filename
    76173