Title :
A new approach to random aperture errors
Author :
Tripp, Victor K.
Author_Institution :
Georgia Institute of Technology, Atlanta, GA, USA
Keywords :
Aperture antennas; Convolution; Error analysis; Fourier transforms; Integral equations; Reflector antennas; Scattering; Statistical distributions; Statistics; Weapons;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1981
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/APS.1981.1148555
