Title :
Approximate methods of solution for element patterns in thinned arrays
Author_Institution :
Raytheon Company, Wayland, MA, USA
Keywords :
Admittance; Apertures; Contracts; Equations; Graphics; Mutual coupling; Performance analysis; Scattering; Visualization; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1981
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/APS.1981.1148561
