DocumentCode :
2765262
Title :
Ultra-wideband signals in a Rician fading channel
Author :
Jalloul, Louay M A
Author_Institution :
Infineon Technol. MorphICs Inc., San Jose, CA, USA
Volume :
7
fYear :
2004
fDate :
26-29 Sept. 2004
Firstpage :
5325
Abstract :
This paper presents an analysis of the link performance of ultra-wideband (UWB) signals using a new figure of merit which is based on ability of UWB signals to mitigate the effect of channel fading. The new figure of merit is defined as the coefficient of variation (CV) of the received wideband signal power, which is a measure of the variation in the received signal power around its mean. A general expression for the CV of the received signal power for UWB signals in Rician fading multipath channels is derived. The CV expression is a function of multiple parameters: transmitted signal pulse energy spectral density, the chip duration, the channel delay spread and the specular-to-diffuse power ratio (also known as the Rician K-factor). It is shown that CV decreases with bandwidth spreading. An expression for the bit error rate is derived that depends on the CV of the received signal power. The CV can then be used as a measure for comparing the effect of pulse shapes on the system performance.
Keywords :
Rician channels; channel estimation; delay estimation; error statistics; multipath channels; spread spectrum communication; ultra wideband communication; Rician K-factor; Rician fading channel; Rician fading multipath channels; UWB radio systems; UWB signals; bandwidth spreading; bit error rate; channel delay spread; channel fading effect mitigation; chip duration; direct sequence spread spectrum; figure of merit; link performance; pulse shape effects; received wideband signal power variation coefficient; specular-to-diffuse power ratio; system performance; transmitted signal pulse energy spectral density; ultra-wideband signals; Fading; Genetic expression; Performance analysis; Power measurement; Pulse measurements; Rician channels; Semiconductor device measurement; Shape measurement; Signal analysis; Ultra wideband technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
ISSN :
1090-3038
Print_ISBN :
0-7803-8521-7
Type :
conf
DOI :
10.1109/VETECF.2004.1405119
Filename :
1405119
Link To Document :
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