DocumentCode
2765330
Title
Signal-to-Interference-Plus-Noise Ratio Analysis for Direct-Sequence Ultra-Wideband Systems
Author
Lee, Cheng-Chia ; Wu, Wei-De ; Chao, Chi-chao
Author_Institution
Inst. of Commun. Eng., National Tsing Hua Univ., Hsinchu
fYear
2007
fDate
11-15 March 2007
Firstpage
1763
Lastpage
1767
Abstract
In this paper, exact signal-to-interference-plus-noise ratio (SINR) analysis of direct-sequence ultra-wideband (UWB) systems with rake receiving in the presence of inter-symbol interference and multiple-access interference over realistic UWB channel models is conducted. The SINR expression, considering the code correlation functions and a generic rake receiver with variable number of combining fingers, is first derived. The statistics of the UWB channel models, defined by the IEEE 802.15.3a Task Group, are then taken into account. Because of the high multipath resolution offered by UWB signals, the UWB channel exhibits a unique path-arriving phenomenon, which can, however, complicate the analysis. Nevertheless, by exploiting the property of Poisson path arrivals, the exact average SINR is obtained in this paper. The analytical results well match computer simulations and can readily be applied to the performance evaluation or system optimization over realistic channel and interference models.
Keywords
personal area networks; radio receivers; radiofrequency interference; spread spectrum communication; ultra wideband communication; IEEE 802.15.3a Task Group; Poisson path arrivals; UWB channel; code correlation functions; direct-sequence ultra-wideband systems; inter-symbol interference; multipath resolution; multiple-access interference; rake receiver; signal-to-interference-plus-noise ratio analysis; Fading; Fingers; Multipath channels; Multiple access interference; Performance analysis; Signal analysis; Signal resolution; Signal to noise ratio; Statistics; Ultra wideband technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless Communications and Networking Conference, 2007.WCNC 2007. IEEE
Conference_Location
Kowloon
ISSN
1525-3511
Print_ISBN
1-4244-0658-7
Electronic_ISBN
1525-3511
Type
conf
DOI
10.1109/WCNC.2007.331
Filename
4224576
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