Title :
Platform for strainable, tem-compatible, mems-embedded carbon nanotube transistors
Author :
Muoth, M. ; Lee, Sang-Won ; Hierold, C.
Author_Institution :
Micro Dept. of Mech. & Process Eng., ETH Zurich, Zurich, Switzerland
Abstract :
Single-walled carbon nanotubes (SWNTs) can exhibit large electromechanical responses to strain and are therefore promising candidates for next generation nano-electromechanical systems (NEMS). A platform for SWNT integration is presented that aims for strainable, TEM-compatible field-effect transistors, useful for both fundamental investigations and new device concepts. Here, we show the first chirality assignment to a suspended ultraclean SWNT field-effect transistor fabricated by the on-chip shadow masking technique, allowing for qualitative, and prospectively quantitative, verification of experimental data. Carbon nanotubes are tensile loaded via thermomechanical MEMS actuators inside a transmission electron microscope, where Pd beads are used to identify the strain regime.
Keywords :
carbon nanotubes; electric actuators; field effect transistors; micromechanical devices; nanoelectromechanical devices; nanofabrication; palladium; transmission electron microscopy; C; Pd; TEM-compatible field-effect transistors; chirality assignment; electromechanical response; nanoelectro-mechanical system; on-chip shadow masking technique; single-walled carbon nanotube; strain; thermomechanical MEMS actuator; transmission electron microscope; Carbon nanotubes; Diffraction; Micromechanical devices; Microscopy; Strain; Transistors;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-9632-7
DOI :
10.1109/MEMSYS.2011.5734367