Title :
An improved design of the swept-frequency automatic-Z-measuring schemes using multiple probes
Author :
Hu, China-Lun J.
Author_Institution :
University of Colorado, Boulder, CO, USA
Keywords :
Degradation; Diodes; Displays; Equations; Frequency; Microwave measurements; Oscilloscopes; Probes; Transforms; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1981
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/APS.1981.1148616
