DocumentCode

2766133

Title

An improved design of the swept-frequency automatic-Z-measuring schemes using multiple probes

Author

Hu, China-Lun J.

Author_Institution

University of Colorado, Boulder, CO, USA

Volume

19

fYear

1981

fDate

16-19 June 1981

Firstpage

265

Lastpage

266

Keywords

Degradation; Diodes; Displays; Equations; Frequency; Microwave measurements; Oscilloscopes; Probes; Transforms; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1981

Conference_Location

Los Angeles, CA, USA

Type

conf

DOI

10.1109/APS.1981.1148616

Filename

1148616