• DocumentCode
    2766146
  • Title

    Design analysis of ZnO/cSi heterojunction solar cell

  • Author

    Nawaz, Muhammad ; Marstein, E.S. ; Holt, Arve

  • Author_Institution
    Univ. Grad. centre (UNIK), Kjeller, Norway
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    This work deals with the design evaluation of n-ZnO/p-cSi and p-ZnO/n-cSi heterojunction solar cells using two dimensional numerical computer aided design tool (TCAD). Various physical parameters of the layer structure such as doping and thickness of the ZnO and cSi layers have been studied. The device performance is evaluated by implementing special models (i.e., surface recombinations, interface traps, thermionic field emission tunneling model for carrier transport at the heterojunction etc) at the semiconductor-semiconductor interfaces. A current density of 47 mA/cm2, open circuit voltage of 0.526 V and efficiency of 19% was achieved for n-ZnO/p-cSi heterojunction for 40 - 80 nm thick i-ZnO layer. An electron affinity value range between 4.0 - 4.5 gives the best performance which fairly justifies the experimental values of the electron affinity of ZnO. Compared to reference crystalline Si device, external quantum efficiency of n-ZnO/p-cSi was increased (because of the increased absorption in ZnO) for smaller wavelengths. Contrary to n-ZnO/p-cSi structure, p-ZnO/n-cSi heterojunction shows poor photovoltaic response because photogenerated holes cannot surmount the large potential barrier (i.e., valence band offset) and hence these holes remain uncollected at the respective contact of the device.
  • Keywords
    II-VI semiconductors; electron affinity; semiconductor doping; silicon; solar cells; surface recombination; valence bands; wide band gap semiconductors; zinc compounds; TCAD; ZnO-Si; carrier transport; doping; efficiency 19 percent; electron affinity value; heterojunction solar cell; interface traps; layer structure; photogenerated holes; semiconductor-semiconductor interface; size 40 nm to 80 nm; surface recombinations; thermionic field emission tunneling; two dimensional numerical computer aided design tool; valence band offset; voltage 0.526 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616070
  • Filename
    5616070