DocumentCode :
2766665
Title :
Economic impacts and approaches to address hot-spot defects in photovoltaic devices
Author :
Hudson, J. ; Vasilyev, L. ; Schmidt, J. ; Horner, G.
Author_Institution :
Tau Sci. Corp., Mountain View, CA, USA
fYear :
2010
fDate :
20-25 June 2010
Abstract :
The topic of hotspots in solar cells has gained recent press, and is garnering a degree of industry attention due to the link between hotspots and module failure modes such as laminate damage (bubbles) or permanent localized cell degradation. Hotspot detection is not new to the industry, although the methods have improved considerably as infrared cameras and analysis algorithms have increased in performance. Historically the focus of hotospot detection has been in R&D labs where priority is placed on detailed root cause analysis and resolution, and cost is a secondary issue. Recently, PV manufacturers have started to implement inline hotspot screening, both at cell and module test, with an emphasis on cost of ownership, measurement speed, and purpose-built features that screen for hotspots in a completely automated fashion. This paper describes a time-resolved thermography system designed for use in PV manufacturing for quality control, and outlines economic factors that are causing this type of cell screening to be introduced inline.
Keywords :
cameras; infrared detectors; solar cells; bubbles; economic impacts; hot-spot defects; hotspot detection; infrared cameras; inline hotspot screening; laminate damage; module failure modes; photovoltaic devices; quality control; solar cells; time-resolved thermography system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5616102
Filename :
5616102
Link To Document :
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