Title :
Analysis of Chaotic Semiconductor Laser Diodes
Author :
Toomey, J.P. ; Kane, D.M.
Author_Institution :
Macquarie Univ., Sydney
Abstract :
Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.
Keywords :
chaos; semiconductor lasers; time series; chaotic semiconductor laser diode; chaotic time series analysis; measurement equipment bandwidth; multiGHz output power fluctuation; signal-to-noise ratio; Bandwidth; Chaos; Diode lasers; Measurement standards; Power generation; Power measurement; Signal to noise ratio; Standards development; Time measurement; Time series analysis; chaos; semiconductor laser, analysis, dimension;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2006 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
978-1-4244-0578-7
Electronic_ISBN :
978-1-4244-0578-7
DOI :
10.1109/COMMAD.2006.4429906
