DocumentCode :
2767437
Title :
Quality factor improvement of silicon nitride micro string resonators
Author :
Schmid, S. ; Malm, B. ; Boisen, A.
Author_Institution :
Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
fYear :
2011
fDate :
23-27 Jan. 2011
Firstpage :
481
Lastpage :
484
Abstract :
Resonant micro and nano strings are of interest for sensor applications due to their extraordinary high quality factors, low mass and tunable resonant frequency. It has been found that the quality factor of strings is usually limited by clamping loss. In this work, clamping loss has been addressed by varying the clamping design and string geometry. We present silicon nitride micro strings with quality factors (Q) of up to 4 million in high vacuum achieved by minimizing clamping loss. For applications such as for chemical sensing, strings need to vibrate at atmospheric pressure. Maximal quality factor values in air were measured for the shortest strings with the highest resonant frequency having an optimal width to height ratio.
Keywords :
clamps; damping; micromechanical resonators; silicon compounds; clamping loss; high quality factors; low mass; quality factor improvement; silicon nitride microstring resonators; tunable resonant frequency; Atmospheric measurements; Atmospheric modeling; Clamps; Damping; Q factor; Resonant frequency; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
ISSN :
1084-6999
Print_ISBN :
978-1-4244-9632-7
Type :
conf
DOI :
10.1109/MEMSYS.2011.5734466
Filename :
5734466
Link To Document :
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