DocumentCode :
2767521
Title :
Study on the reliability of the mechanical shutter utilizing roll actuators
Author :
Kim, Che-Heung ; Hong, Seogwoo
Author_Institution :
SAIT, Samsung Electron. Co., Ltd., Giheung, South Korea
fYear :
2011
fDate :
23-27 Jan. 2011
Firstpage :
501
Lastpage :
504
Abstract :
This paper handles a single approach to solve two major reliability issues of the previously proposed micro shutter using roll actuators. Material and structural change from Al/SiNx to Mo/Mo improves the temperature stability of an aperture size by matching CTEs of bi-layer ideally. It is also effective to extend the rated lifetime of the shutter by eliminating a dielectric charging layer, SiNx. The measured temperature-invariant diameter of the Mo/Mo roll from 25°C to 80°C is compared with a dramatic change of the former Al/SiNx roll, which proves our approach effective. The rated lifetime reaches 200,000 (5 times higher than the previous work) just after applying Mo/Mo roll and 350,000 (1.7 times more) when dimples are added on it.
Keywords :
dielectric materials; microactuators; micromechanical devices; reliability; dielectric charging layer; mechanical shutter; micro shutter; reliability; roll actuators; temperature 25 degC to 80 degC; Apertures; Fixtures; Materials; Metals; Reliability; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
ISSN :
1084-6999
Print_ISBN :
978-1-4244-9632-7
Type :
conf
DOI :
10.1109/MEMSYS.2011.5734471
Filename :
5734471
Link To Document :
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