Title :
4.8 MHz AFM nanoprobes with capacitive transducers and batch-fabricated nanotips
Author :
Walter, B. ; Faucher, M. ; Mairiaux, E. ; Xiong, Z. ; Buchaillot, L. ; Legrand, B.
Author_Institution :
Inst. d´´Electron., de Microelectron. et de Nanotechnol., CNRS, Villeneuve d´´Ascq, France
Abstract :
We report here on high resonance frequency AFM probes based on MEMS bulk mode resonators. They consist on silicon ring resonators with capacitive transducers vibrating in the in-plane elliptic mode. Nano-tips placed at the maximum of vibration are fabricated in batch process. After electrical and optical characterizations, chips supporting the resonator and the prominent tip are extracted from the wafer. Next, the AFM nanoprobes are integrated in a commercially available AFM set-up with a modified probe holder. Experimental results of high resonance frequency AFM images are presented.
Keywords :
atomic force microscopy; capacitive sensors; elemental semiconductors; micromechanical resonators; silicon; AFM images; AFM nanoprobes; MEMS bulk mode resonators; Si; batch-fabricated nanotips; capacitive transducers; elliptic mode; frequency 4.8 MHz; resonance frequency; silicon ring resonators; Electrodes; Frequency measurement; Nanobioscience; Optical resonators; Probes; Resonant frequency; Vibrations;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-9632-7
DOI :
10.1109/MEMSYS.2011.5734475