DocumentCode :
2767590
Title :
4.8 MHz AFM nanoprobes with capacitive transducers and batch-fabricated nanotips
Author :
Walter, B. ; Faucher, M. ; Mairiaux, E. ; Xiong, Z. ; Buchaillot, L. ; Legrand, B.
Author_Institution :
Inst. d´´Electron., de Microelectron. et de Nanotechnol., CNRS, Villeneuve d´´Ascq, France
fYear :
2011
fDate :
23-27 Jan. 2011
Firstpage :
517
Lastpage :
520
Abstract :
We report here on high resonance frequency AFM probes based on MEMS bulk mode resonators. They consist on silicon ring resonators with capacitive transducers vibrating in the in-plane elliptic mode. Nano-tips placed at the maximum of vibration are fabricated in batch process. After electrical and optical characterizations, chips supporting the resonator and the prominent tip are extracted from the wafer. Next, the AFM nanoprobes are integrated in a commercially available AFM set-up with a modified probe holder. Experimental results of high resonance frequency AFM images are presented.
Keywords :
atomic force microscopy; capacitive sensors; elemental semiconductors; micromechanical resonators; silicon; AFM images; AFM nanoprobes; MEMS bulk mode resonators; Si; batch-fabricated nanotips; capacitive transducers; elliptic mode; frequency 4.8 MHz; resonance frequency; silicon ring resonators; Electrodes; Frequency measurement; Nanobioscience; Optical resonators; Probes; Resonant frequency; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
ISSN :
1084-6999
Print_ISBN :
978-1-4244-9632-7
Type :
conf
DOI :
10.1109/MEMSYS.2011.5734475
Filename :
5734475
Link To Document :
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