DocumentCode
2768003
Title
Integrating a partial least squares model with an artificial neural network to discriminate FTIR spectra of virus infected vero cells at 6 hours post exposure
Author
Ward, John A. ; Filfili, Chadi ; Wang, Ruli ; Hastings, Gary ; Guo, Jing ; Hsu, Yu-Sheng ; Katz, David ; Hilliard, Julia
Author_Institution
Brooke Army Med. Center, Houston, TX, USA
fYear
2011
fDate
12-15 Nov. 2011
Firstpage
1063
Lastpage
1065
Abstract
A partial least squares regression (PLSR) model that classified the FTIR spectra of Mock, Coxsackievirus and HSV1 infected vero cells with sensitivities of 85%, 85% and 90%, respectively, was developed. Fourteen discriminators obtained by partial least squares regression performed on difference spectra from 20 independent infection experiments were examined. Sorting the FTIR absorbance of the five best discriminators and dividing them into equal intervals gave an accuracy of 92%. This constitutes proof of concept at 6 hours post exposure for discriminating two infections from each other and from Mock infected cells. When the PLSR model was combined with a 14×7×3 artificial neural network, the best sensitivity and accuracy were obtained with the neural network trained to an RMS error of 0.100 within 400,000 iterations. The sensitivities were Mock = 80%, HSV1 = 90% and Coxsackievirus = 70%, for an overall accuracy of 80% based on 10 Mock, 10 HSV1 and 10 Coxsackievirus test samples.
Keywords
Fourier transform spectra; infrared spectra; iterative methods; least squares approximations; medical computing; microorganisms; national security; neural nets; Coxsackievirus; FTIR absorbance; FTIR spectra; HSV1 infected vero cells; Mock infected cells; RMS error; artificial neural network; homeland security; infection experiment; iteration; partial least squares regression model; time 6 hour; Accuracy; Artificial neural networks; Educational institutions; Mathematical model; Pathogens; Sensitivity; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioinformatics and Biomedicine Workshops (BIBMW), 2011 IEEE International Conference on
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4577-1612-6
Type
conf
DOI
10.1109/BIBMW.2011.6112562
Filename
6112562
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