Title :
Collimation and focusing of wave beams with metal-plate lens antennas analyzed using nystrom-type MDS algorithm
Author :
Nosich, Andrey A. ; Gandel, Yuriy V. ; Matsushima, Akira ; Sauleau, Ronan
Author_Institution :
Sch. of Math., Kharkiv Nat. Univ., Kharkiv
Abstract :
We present a full-wave numerical study and design of the 2-D model of a perfectly electric conducting (PEC) parallel-plate lens structure. The underlining idea is that the power of electromagnetic waves can be focused or collimated by arranging flat metal strips in parallel to one another (for instance, see Fig. 1-a) and adjusting the transverse and longitudinal dimensions of the waveguide regions to provide a necessary phase correction. Simple engineering principles for designing such metal-plate lenses are known from [1-3]. As for the full-wave analysis, they seem to have been accurately considered only in [4] with the coupled Singular Integral Equations (SIEs) regularized by using a projection on the weighted Chebyshev polynomials, which are the orthogonal eigenfunctions of the static parts of the SIE operators.
Keywords :
Chebyshev approximation; eigenvalues and eigenfunctions; electromagnetic waves; integral equations; lens antennas; waveguide antennas; 2D model; Nystrom-type MDS algorithm; coupled singular integral equations; eigenfunctions; electromagnetic waves power; full-wave analysis; longitudinal dimensions; metal-plate lens antennas; method of discrete singularities; perfectly electric conducting parallel-plate lens structure; phase correction; transverse dimensions; wave beams collimation; wave beams focusing; waveguide regions; weighted Chebyshev polynomials; Algorithm design and analysis; Chebyshev approximation; Collimators; Design engineering; Electromagnetic scattering; Electromagnetic waveguides; Integral equations; Lenses; Optical design; Power engineering and energy;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619381