DocumentCode
2768927
Title
Reranking machine translation hypotheses with structured and web-based language models
Author
Wang, Wen ; Stolcke, Andreas ; Zheng, Jing
Author_Institution
SRI Int., Menlo Park
fYear
2007
fDate
9-13 Dec. 2007
Firstpage
159
Lastpage
164
Abstract
In this paper, we investigate the use of linguistically motivated and computationally efficient structured language models for reranking N-best hypotheses in a statistical machine translation system. These language models, developed from constraint dependency grammar parses, tightly integrate knowledge of words, morphological and lexical features, and syntactic dependency constraints. Two structured language models are applied for N-best rescoring, one is an almost-parsing language model, and the other utilizes more syntactic features by explicitly modeling syntactic dependencies between words. We also investigate effective and efficient language modeling methods to use N-grams extracted from up to 1 teraword of web documents. We apply all these language models for N-best re-ranking on the NIST and DARPA GALE program1 2006 and 2007 machine translation evaluation tasks and find that the combination of these language models increases the BLEU score up to 1.6% absolutely on blind test sets.
Keywords
computational linguistics; document handling; grammars; language translation; natural languages; statistical analysis; N-best rescoring; Web documents; Web-based language model; constraint dependency grammar parses; parsing language model; reranking N-best hypotheses; reranking machine translation; statistical machine translation system; structured language model; syntactic dependency constraint; Decoding; Entropy; Error analysis; Laboratories; NIST; Natural languages; Smoothing methods; Speech; Surface-mount technology; Testing; N-best reranking; Statistical machine translation; smoothing; structured language model; web-based language modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Speech Recognition & Understanding, 2007. ASRU. IEEE Workshop on
Conference_Location
Kyoto
Print_ISBN
978-1-4244-1746-9
Electronic_ISBN
978-1-4244-1746-9
Type
conf
DOI
10.1109/ASRU.2007.4430102
Filename
4430102
Link To Document