Title :
Hybrid physical field simulation: Transient electro-thermo-mechanical responses of interwafer interconnects under the impact of an EMP
Author :
Kong, Fan-Zhi ; Yin, Wen-Yan ; Mao, Jun-Fa ; Liu, Qing Huo
Author_Institution :
Center for Microwave & RF Technol., Shanghai Jiao Tong Univ., Shanghai
Abstract :
Time-dependent electro-thermo-mechanical transient responses of interwafer interconnects under the impact of an EMP are investigated in this paper. The mathematical methodology is based on hybrid physical field time-domain finite element method (FEM), in which all nonlinearities of temperature-dependent electrical conductivities, thermal conductivities, thermal expansion coefficients, and even the Youngpsilas modulus of materials involved are treated rigorously. Therefore, three-dimensional (3-D) temperature and thermal stress distributions of one- and two-level metal bridge-vias in multi-level interwafer interconnects used for high-density integration of ICs are captured numerically and discussed.
Keywords :
Young´s modulus; electromechanical effects; finite element analysis; integrated circuit interconnections; integrated circuit manufacture; radiation hardening (electronics); thermal conductivity; EMP; FEM; Youngpsilas modulus; hybrid physical field simulation; hybrid physical field time-domain finite element method; interwafer interconnects; temperature-dependent electrical conductivities; thermal conductivities; thermal expansion coefficients; thermal stress distributions; three-dimensional temperature; transient electro-thermo-mechanical responses; Couplings; EMP radiation effects; Electrostatic discharge; Nonlinear equations; Temperature distribution; Thermal conductivity; Thermal expansion; Thermal stresses; Three-dimensional integrated circuits; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619420