Title :
Hyperspectral feature extraction using contourlet transform
Author :
Long, Zhiling ; Du, Qian ; Younan, Nicolas H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Mississippi State Univ., Starkville, MS, USA
Abstract :
In this paper, we explore hyperspectral feature extraction using the contourlet transform (CT), a promising multireolution analysis technique emerging in recent years. Hyperspectral imagery is first processed in the spectral domain with some decorrelation techniques. Then the nonsubsampled CT (NSCT) is applied in the spatial domain. The resulting NSCT coefficients are used as features for hyperspectral analysis. The spectral processing techniques being explored include one-dimensional discrete wavelet transform, principal component analysis, and band selection. The extracted features are tested in classification using support vector machine, which yield promising results.
Keywords :
discrete wavelet transforms; feature extraction; image classification; image resolution; principal component analysis; support vector machines; NSCT coefficients; band selection; contourlet transform; decorrelation techniques; hyperspectral feature extraction; hyperspectral imagery; multireolution analysis technique; nonsubsampled CT; one-dimensional discrete wavelet transform; principal component analysis; spectral domain; spectral processing techniques; support vector machine; Abstracts; Accuracy; Eigenvalues and eigenfunctions; Software; Vectors;
Conference_Titel :
Pattern Recognition in Remote Sensing (PRRS), 2012 IAPR Workshop on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-4960-4
DOI :
10.1109/PPRS.2012.6398317