Title :
Keynote speaker: Driving innovation in the "post-silicon" world
Author :
Meyerson, Bernard S.
Author_Institution :
Innovation & Global University Relations, IBM Systems and Technology Group
Abstract :
For a long time there have been those who postulated the "end of the line" for silicon technology. Invariably, silicon technology survived and thrived following such dire predictions. The fundamental issue behind such predictions was the notion that manufacturing issues such as lithographic pattern definition would cause progress in silicon technology to stall, yet such limits were routinely overcome. However, the laws of physics are not malleable, and we now approach such limits in CMOS. The onset of quantization in highly scaled devices leaves "only" an order of magnitude in device density to work with before limits of classical devices are reached. This talk will explore the coming transition to a "post-silicon" world, where integration, architecture, and numerous scaling independent initiatives will dominate as drivers of IT performance.
Keywords :
elemental semiconductors; innovation management; semiconductor technology; silicon; CMOS; IT performance; classical devices; device density; highly-scaled devices; innovation; lithographic pattern definition; manufacturing issues; post-silicon world; silicon technology;
Conference_Titel :
SOC Conference (SOCC), 2012 IEEE International
Conference_Location :
Niagara Falls, NY
Print_ISBN :
978-1-4673-1294-3
DOI :
10.1109/SOCC.2012.6398342