• DocumentCode
    2769910
  • Title

    Instantaneous Symbol Error Outage Probability over Fading Channels with Imperfect Channel State Information

  • Author

    Wu, Mingwei ; Kam, Pooi Yuen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2010
  • fDate
    16-19 May 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We propose to use the probability of instantaneous symbol error outage (ISEO) as a performance measure for digital communication over wireless channels. It is defined as the probability that the instantaneous symbol error probability (ISEP) exceeds an ISEP threshold. We analyze the impact of imperfect channel state information (CSI) on the ISEO probability over Rayleigh fading channels. A simple, but tight, closed-form upper bound on the ISEO probability is obtained as a function of the channel estimation mean square error (MSE). It is shown that the ISEO performance improves rapidly with decreasing MSE, when MSE drops below a certain value, which is determined partly by the ISEP threshold chosen. As CSI is commonly obtained by pilot-symbol-assisted channel estimation in packet transmission, we obtain the optimum allocation of pilot and data energy in a frame that minimizes the ISEO probability, which also minimizes the instantaneous packet error outage probability.
  • Keywords
    Rayleigh channels; channel estimation; digital communication; error statistics; mean square error methods; ISEO probability; Rayleigh fading channels; channel estimation; closed-form upper bound; digital communication; imperfect channel state information; instantaneous symbol error outage probability; mean square error method; wireless channel; AWGN; Channel estimation; Channel state information; Fading; Probability; Quality of service; Rayleigh channels; Shadow mapping; Statistical distributions; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC 2010-Spring), 2010 IEEE 71st
  • Conference_Location
    Taipei
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-2518-1
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2010.5493772
  • Filename
    5493772