Title :
An End-to-End Cross-Layer Profiling Study of Congestion Control in High BDP Wireless Networks
Author :
Zadeh, Homayoun Yousefi ; Li, Xiaolong ; Habibi, Amir
Author_Institution :
Dept. of EECS, California Univ., Irvine, CA
Abstract :
We describe a cross-layer study that attempts at profiling the performance of end-to-end congestion control protocols in high BDP wireless networks. Packets transmitted over such networks are assumed to face temporally correlated random bit errors caused by fading and/or blocking. We utilize a finite-state Markov chain to model bit error characteristics and apply per packet link layer FEC codes in order to compensate for such errors. Utilizing our model along with loss expressions, we profile the end-to-end performance of XCP, VCP, and TCP/AQM+ECN congestion control protocols. Based on our profiling results, we observe that (1) the performance of any congestion control protocol highly degrades without properly protecting its data and signaling information against random bit errors, (2) utilizing multiple antenna nodes improves the transient characteristics of the congestion control protocol in terms of utilization and packet error rates, and (3) XCP and VCP represent the best alternatives of congestion control for high bandwidth moderate delay and moderate bandwidth large delay environments, respectively.
Keywords :
Markov processes; error statistics; forward error correction; telecommunication congestion control; transport protocols; wireless channels; FEC codes; TCP/AQM+ECN; VCP; XCP; bit error characteristics; congestion control protocols; data link layer; end-to-end cross-layer profiling; finite-state Markov chain; high BDP wireless networks; multiple antenna nodes; packet error rates; random bit errors; transient characteristics; Bandwidth; Degradation; Delay; Error correction; Fading; Forward error correction; Performance loss; Protection; Wireless application protocol; Wireless networks;
Conference_Titel :
Wireless Communications and Networking Conference, 2007.WCNC 2007. IEEE
Conference_Location :
Kowloon
Print_ISBN :
1-4244-0658-7
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2007.627