Title :
Diode-switched reflectors and lenses
Author :
Wang, J. J H ; Blount, D.R. ; Ryan, C.E., Jr. ; Puskar, R.J.
Author_Institution :
Georgia Institute of Technology, Atlanta, GA, USA
Keywords :
Bonding; Electromagnetic scattering; Fabrication; Frequency measurement; Lenses; Microwave devices; Microwave technology; Semiconductor diodes; Testing; Thermal stresses;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1982
Conference_Location :
Albuquerque, NM, USA
DOI :
10.1109/APS.1982.1148846
