• DocumentCode
    2770225
  • Title

    Ionic charge accumulation at microscopic interfaces in filled composites

  • Author

    Yutao, Zhu ; Xinheng, Wang ; Hengkun, Xie ; Yaonan, Liu

  • Author_Institution
    State Key Lab. of Electr. Insulation for Power Equipment, Xian Jiaotong Univ., Xi´´an, China
  • Volume
    2
  • fYear
    1996
  • fDate
    16-19 Jun 1996
  • Firstpage
    451
  • Abstract
    In this paper, the charge accumulation process at microscopic interfaces in insulating materials filled with inorganic fillers is analyzed by using a unit model. Dynamic equations of interfacial ionic charge accumulation are proposed by the authors. The charge accumulation and its regulations are proved by TSC test results obtained on silica filled EPDM samples
  • Keywords
    composite insulating materials; electric breakdown; electric charge; electrostatics; filled polymers; silicon compounds; Dupont 2772; charge accumulation process; dynamic equations; filled composite insulation; inorganic fillers; insulating materials; microscopic interfaces; silica-filled EPDM; Composite materials; Conducting materials; Conductivity; Dielectric materials; Dielectrics and electrical insulation; Inorganic materials; Microscopy; Plastic insulation; Polymers; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-3531-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1996.549379
  • Filename
    549379