DocumentCode :
2770225
Title :
Ionic charge accumulation at microscopic interfaces in filled composites
Author :
Yutao, Zhu ; Xinheng, Wang ; Hengkun, Xie ; Yaonan, Liu
Author_Institution :
State Key Lab. of Electr. Insulation for Power Equipment, Xian Jiaotong Univ., Xi´´an, China
Volume :
2
fYear :
1996
fDate :
16-19 Jun 1996
Firstpage :
451
Abstract :
In this paper, the charge accumulation process at microscopic interfaces in insulating materials filled with inorganic fillers is analyzed by using a unit model. Dynamic equations of interfacial ionic charge accumulation are proposed by the authors. The charge accumulation and its regulations are proved by TSC test results obtained on silica filled EPDM samples
Keywords :
composite insulating materials; electric breakdown; electric charge; electrostatics; filled polymers; silicon compounds; Dupont 2772; charge accumulation process; dynamic equations; filled composite insulation; inorganic fillers; insulating materials; microscopic interfaces; silica-filled EPDM; Composite materials; Conducting materials; Conductivity; Dielectric materials; Dielectrics and electrical insulation; Inorganic materials; Microscopy; Plastic insulation; Polymers; Silicon compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1089-084X
Print_ISBN :
0-7803-3531-7
Type :
conf
DOI :
10.1109/ELINSL.1996.549379
Filename :
549379
Link To Document :
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