Title :
Evaluation of All Routes and Terminal Reliability in the Data Vortex All Optical Switch for High Performance Computing
Author :
Sharma, Neha ; Chadha, D. ; Chandra, Vinod
Author_Institution :
Dept. of Electron. & Commun., Indira Gandhi Gov. Eng. Coll. Sagar, Sagar, India
Abstract :
In this paper, we have given a detail procedure to determine all-possible paths for all source - destination pairs in the data vortex all optical switch, and the terminal pair reliability performance of the switch has been obtained, using a simple analytical method. The paths found can also have applications for the study of survivability and quality of service implementations in the switch. The reliability expression is useful for evaluating the performance of the data vortex switch for a given reliability requirement and to provide the quantitative comparisons with other interconnection networks.
Keywords :
circuit reliability; multiprocessor interconnection networks; network routing; optical switches; quality of service; data vortex; high performance computing; interconnection networks; optical switch; quality of service; route evaluation; source-destination pairs; terminal pair reliability performance; Communication systems; Computational intelligence; all optical networks; all routes; data vortex; terminal reliability;
Conference_Titel :
Computational Intelligence and Communication Networks (CICN), 2011 International Conference on
Conference_Location :
Gwalior
Print_ISBN :
978-1-4577-2033-8
DOI :
10.1109/CICN.2011.75
