Efficient fault emulation using automatic pre-injection memory access analysis

The complexity of SoCs has been increasing enormously over the last years. This increases the effort for testing the SoCs against natural external influences and fault attacks. These tests require a huge amount of time because of the large fault scenario space. In this paper a novel method is presented on reduction of system test duration. This speed-up is reached by observing memory accesses during a golden model run to find security relevant regions in memories. Therefore, a novel monitor module has been designed and tested which stores the used memory addresses together with the access time stamps.