DocumentCode :
2770323
Title :
Microwave imaging of two-dimensional scatterers by inverting scattered near-field measurements
Author :
Rekanos, I.T. ; Efraimidon, M.S. ; Yioultsis, T.V. ; Antonopoulos, C.S. ; Tsiboukis, T.D. ; Kriezis, E.E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece
fYear :
2000
fDate :
15-18 Aug. 2000
Firstpage :
187
Lastpage :
190
Abstract :
A spatial domain technique for the reconstruction of the electromagnetic properties of unknown scatterers is presented. The new methodology combines the finite element method (FEM) and the Polak-Ribiere nonlinear conjugate gradient optimization algorithm. The forward scattering problem is treated via the FEM, while inversion is implemented by minimizing a cost function, consisting of a standard error term and a regularization term. The first one is related to the scattered near-field measurements, obtained by illuminating the scatterer with plane waves from various directions. A sensitivity analysis, performed by an elaborate finite element procedure, provides the direction required for correcting the scatterer profile. Significant reduction of the computation time is obtained by introducing the adjoint state vector methodology.
Keywords :
electric field measurement; electromagnetic wave scattering; finite element analysis; image reconstruction; inverse problems; microwave imaging; optimisation; sensitivity analysis; FEM; adjoint state vector method; computation time reduction; cost function minimisation; electromagnetic properties reconstruction; finite element method; forward scattering; microwave imaging; nonlinear conjugate gradient optimization algorithm; plane waves illumination; regularization term; scattered near-field measurements inversion; scatterer profile correction; sensitivity analysis; spatial domain technique; standard error term; two-dimensional scatterers; Biomedical measurements; Cost function; Electromagnetic scattering; Finite element methods; Geophysical measurements; Image reconstruction; Material properties; Microwave imaging; Microwave measurements; Sensitivity analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas, Propagation and EM Theory, 2000. Proceedings. ISAPE 2000. 5th International Symposium on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6377-9
Type :
conf
DOI :
10.1109/ISAPE.2000.894756
Filename :
894756
Link To Document :
بازگشت